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Sometimes it is very difficult to characterise the ohmicity of the metal-semiconductor contact using transmission line model (TLM) measurements, particularly for the semiconductor having a high workfunction. The TLM data are insufficient for polycrystalline films because of the presence of the grain boundary potential which scatters the carriers during their flow along the horizontal direction. Thus...
A new technique, the magnetic field assisted bonding is described for proper encapsulation of a thin-film Cu2S-CdS solar cell. This is made possible by using a thin layer of nickel coating on the substrate as the back-electrode. Results on the dependence of the series resistance, short-circuit current, open-circuit voltage, shunt resistance, diode ideality factor and fill factor on the magnetic field,...
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