Search results for: J. Wei
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341
IEEE Electron Device Letters > 2011 > 32 > 2 > 128 - 130
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341
IEEE Electron Device Letters > 2011 > 32 > 2 > 128 - 130