Search results for: M.M. Abdallah
2008 3rd International Design and Test Workshop > 177 - 181
IEEE Transactions on Signal Processing > 2008 > 56 > 10-1 > 4772 - 4784
2008 3rd International Design and Test Workshop > 177 - 181
IEEE Transactions on Signal Processing > 2008 > 56 > 10-1 > 4772 - 4784