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The continuous decrease in CMOS technology feature size increases the susceptibility of such circuits to single event transient SET and single event upset SEU, caused by energetic particles striking system wires and flip flops. This paper presents a novel SET/SEU-detection technique for I/O ports where different sampling times used to detect the effects of SET/SEUs. The power dissipation, area, reliability,...
This paper presents a soft error-tolerant architecture to protect embedded processors register files. The proposed architecture is based on selectively duplication of the most vulnerable registers values in a cache memory embedded beside the processor register file so called register cache. To do this, two parity bits are added to each register of the processor to detect up to three contiguous errors...
High reliability, low power consumption and high performance are key objectives in the design of NoCs. These three design objectives should be considered simultaneously in order to have an optimal design. This paper proposes a method to reduce power consumption of an application specific NoC. This is done in two steps: 1) Extra virtual channels are used in the router architecture to increase the performance...
The continuous decrease in CMOS technology feature size increases the susceptibility of such circuits to single event upsets (SEU) caused by the impact of particle strikes on system flip flops. This paper presents a novel SEU-tolerant latch where redundant feedback lines are used to mask the effects of SEUs. The power dissipation, area, reliability, and propagation delay of the presented SEU-tolerant...
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