The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper focuses on the orientation control of the KN thin film on Si wafer by chemical solution deposition (CSD). We selected the PbO layer and PZT layers as the seeding layer in order to control the crystal orientation of the resulting KN thin film. Crystalline phase in KN thin film was identified by XRD, and the degree of c-axis orientation was calculated from XRD analysis. The resultant KN thin...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.