Search results for: C. Ciofi
The European Physical Journal A > 2003 > 17 > 1 > 133-144
Solid State Electronics > 2002 > 46 > 11 > 1807-1813
Microelectronic Engineering > 2001 > 59 > 1-4 > 43-47
Microelectronics Reliability > 2000 > 40 > 8-10 > 1323-1327
Microelectronics Reliability > 2000 > 40 > 8-10 > 1605-1608
Analog Integrated Circuits and Signal Processing > 2000 > 24 > 1 > 73-78
Microelectronics Reliability > 1999 > 39 > 11 > 1691-1696
The European Physical Journal A > 1999 > 5 > 2 > 191-207
Microelectronics Reliability > 1997 > 37 > 10-11 > 1607-1610
Physics Letters B > 1997 > 404 > 3-4 > 223-229
Microelectronics Reliability > 1997 > 37 > 7 > 1079-1085
Journal of Electronic Materials > 1997 > 26 > 8 > L17-L20
Microelectronics Reliability > 1997 > 37 > 1 > 77-85
Microelectronics Reliability > 1996 > 36 > 11-12 > 1851-1854
Microelectronics Reliability > 1996 > 36 > 11-12 > 1747-1750
Solid State Communications > 1996 > 100 > 6 > 403-406
Nuclear Physics, Section A > 1996 > 604 > 4 > 429-440