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Impedance and low frequency noise measurements are valuable and complementary methods for electron device characterization. In this work we propose an integrated method for impedance and low frequency noise measurements in which impedance measurements are performed by means of crosscorrelation low frequency noise measurements. The method is implemented in a three-channel measurement system for the...
In this work we propose a measurement setup topology suitable for the automatic DC and low frequency noise (LFN) characterization of field effect transistors at wafer level. The system is composed of source and measure units (SMUs), by a custom-built low noise amplifier (LNA), and by a PC based spectrum analyzer. No bias filters and switch matrices are used, allowing fast switching between DC and...
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