Search results for: C. Ciofi
Microelectronics Reliability > 1997 > 37 > 10-11 > 1607-1610
Physics Letters B > 1997 > 404 > 3-4 > 223-229
Microelectronics Reliability > 1997 > 37 > 7 > 1079-1085
Microelectronics Reliability > 1997 > 37 > 1 > 77-85
Microelectronics Reliability > 1996 > 36 > 11-12 > 1851-1854
Microelectronics Reliability > 1996 > 36 > 11-12 > 1747-1750
Solid State Communications > 1996 > 100 > 6 > 403-406
Nuclear Physics, Section A > 1996 > 604 > 4 > 429-440
Microelectronics Reliability > 1996 > 36 > 7-8 > 1045-1050
Physics Letters B > 1996 > 376 > 4 > 309-314
Thin Solid Films > 1995 > 264 > 1 > 109-114
Physics Letters B > 1995 > 344 > 1-4 > 79-84