Search results for: X. Chen
Microelectronics Reliability > 2016 > 64 > C > 225-229
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 9 - 12
IEEE Electron Device Letters > 2013 > 34 > 4 > 508 - 510
Physics Procedia > 2012 > 32 > Complete > 885-890
IEEE Electron Device Letters > 2011 > 32 > 11 > 1495 - 1497
Chemistry – A European Journal > 16 > 34 > 10462 - 10473
Surface Science > 2008 > 602 > 2 > 620-629
IEEE Transactions on Nuclear Science > 2008 > 55 > 1-3 > 662 - 666
Nuclear Inst. and Methods in Physics Research, B > 2007 > 264 > 1 > 23-28
Surface Science > 2007 > 601 > 11 > 2378-2383
Surface Science > 1996 > 356 > 1-3 > 28-38
Surface Science > 1996 > 357-358 > 560-564
Surface Science > 1995 > 340 > 1-2 > l983-l987