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Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets, which distinguish pairs of single stuck-at faults n times, to enhance the probability of distinguishing unmodeled defects. The basis for the use of n-distinguishing test sets to enhance defect diagnosis is similar to that...
We extend the concept of forward-looking reverse order fault simulation to n-detection test sets. Forward-looking reverse order fault simulation is an efficient static test compaction process similar to reverse order fault simulation, but with the advantage that it results in test sets that do not contain any unnecessary tests. The application of test compaction procedures to n-detection test sets...
We describe a procedure for forming n-detection test sets for n > 1 without applying a test generation procedure to target faults. The proposed procedure accepts a one-detection test set. It extracts test cubes for target faults from the one-detection test set. It then merges the cubes in different ways to obtain an n-detection test set. We demonstrate that the resulting test set is as effective...
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