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In this paper, we propose a high-level synthesis method targeting generalized distributed-register architecture in which we introduce shared/local registers and global/local controllers. Functional units on a critical path use local registers and local controllers and functional units on non-critical path use shared register and global controller in our architecture. Our method is based on iterative...
Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit under test. However, scan path would be used to discover the internals of crypto hardware, which presents a significant security risk of information leakage. An interesting design-for-test technique by inserting inverters into the internal scan path to complicate the scan structure...
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