Search results for: Ron M.A. Heeren
Applied Surface Science > 2006 > 252 > 19 > 6702-6705
International Journal of Mass Spectrometry > 2006 > 253 > 3 > 181-192
International Journal of Mass Spectrometry > 2006 > 253 > 3 > 217-224
Journal of the American Society for Mass Spectrometry > 2005 > 16 > 10 > 1595-1601
International Journal of Mass Spectrometry > 2005 > 244 > 2-3 > 135-143
Journal of the American Society for Mass Spectrometry > 2004 > 15 > 12 > 1869-1873
International Journal of Mass Spectrometry > 2004 > 231 > 1 > 37-45
Future Generation Computer Systems > 2003 > 19 > 6 > 815-824
Journal of the American Society for Mass Spectrometry > 2003 > 14 > 4 > 332-341
International Journal of Mass Spectrometry > 2003 > 225 > 1 > 71-82
Journal of Cultural Heritage > 2003 > 4 > Supplement 1 > 209-215
Journal of Cultural Heritage > 2003 > 4 > Supplement 1 > 257-263
Journal of Controlled Release > 2000 > 68 > 1 > 31-40
Journal of the American Society for Mass Spectrometry > 2000 > 11 > 6 > 536-543
Journal of the American Society for Mass Spectrometry > 1999 > 10 > 11 > 1074-1082