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In this paper we present the first detailed analysis of von Neumann multiplexing (vN-MUX) using majority (MAJ) gates of small fan-ins Delta (MAJ-Delta) with respect to the probability of failure of the elementary (nano-)devices. Only gates with small fan-ins have been considered, as gates with large fan-ins do not seem practical (at least in the short term) in future technologies. The extensions from...
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