Search results for: Ke Ma
Microelectronics Reliability > 2017 > 76-77 > C > 31-37
IEEE Transactions on Power Electronics > 2015 > 30 > 2 > 590 - 602
Microelectronics Reliability > 2017 > 76-77 > C > 31-37
IEEE Transactions on Power Electronics > 2015 > 30 > 2 > 590 - 602