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Two different thicknesses of NiMn 2 O 4 thin films were prepared on Pt (111)/Ti/SiO 2 /Si substrate by chemical solution deposition method. The microstructure of NiMn 2 O 4 films was characterized by x-ray diffraction and scanning electron microscopy. The optical properties of the films were studied by spectroscopic ellipsometry at room temperature in the spectral...
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