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In this paper, we propose a new test data compression method for reducing test data volume and test application time. The proposed method consists of two steps: scan chain compaction and dictionary-based compression scheme. The scan chain compaction provides a minimum scan chain depth by using compaction of the compatible scan cells in the scan chain. The compacted scan chain is partitioned to the...
Locating the scan chain faults is very important for dedicated IC manufacturers to guide the failure analysis process for yield improvement. In this paper, we propose a new symbolic simulation based scan chain diagnosis method to solve the scan chain diagnosis resolution problem as well as the multiple faults problem. The proposed method uses a new symbolic simulation with the faulty probabilities...
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