Search results for: Chih-Yang Chang
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 187 - 193
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 187 - 193