The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In this article, the effect of proton irradiation on the DC characteristic of InP/InGaAs heterojunction is studied with varying fluences and proton energies. The current-voltage (I–V) before and after proton irradiation are compared. The result indicates that higher device current is caused by lower energy proton irradiation and the increase of fluences for the proton energy less than 3MeV. The density...
The effects of gamma irradiation on Gallium-Arsenide (GaAs) Heterojunction Bipolar Transistor (HBT) is reported. DC and Radio Frequency (RF) performance are investigated for gamma doses up to 7 Mrad(Si). After 7Mrad(Si) gamma irradiation, an increase of base current (lb) is observed, the change is thought to be mainly due to the reduction of the effective minority carrier lifetime (τ) in the n-type...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.