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Stress-strain tensors and stress-free lattice parameters related to the microstructure is studied in YBCO thin films deposited by pulsed-laser ablation on MgO and SrTiO 3 substrates by means of X-ray diffraction and bending test measurements. The results show that the lattice of the thin film deposited on SrTiO 3 is under compression in the (a,b) plane and the stress-free lattice parameters...
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