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Effect of 100MeV 58 Ni +8 ion irradiation on the electrical transport behaviour of Al-Cu-Fe quasicrystalline thin films have been investigated by in situ and ex situ resistivity measurements. The quasicrystalline thin films grown by indirect heating, electron-beam and flash evaporation methods have been used for this purpose. The fluence of 100MeV 58 Ni +...
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