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Poor performance of CdS/CdTe material near the edges of 30x30 cm cells has been observed. This was correlated to poor recrystallisation of the 'edge material' upon annealing. Various techniques - XRD and GAXRD, TEM, SIMS and XPS - have been used in order to carefully map differences in as-deposited material across the cell surface that could be responsible for this effect. The results revealed that...
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