The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Thin films of ZnTe were deposited on glass and Si by pulsed laser ablation at substrate temperatures of 26°C and 286°C. X-ray diffraction studies showed that films deposited at 26°C were amorphous and those deposited at 286°C were polycrystalline, X-ray photoelectron spectroscopy (XPS) showed the Zn:Te ratio to be 49.1:50.9 for both types of films. The band gap of the films deposited at 286°C was...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.