The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Launch-Off-Capture (LOC) and Launch-Off-Shift (LOS) are the two main test schemes for at-speed scan delay testing. In [1, 2], authors proposed a comparison between LOC and LOS, showing that LOS has higher performance than LOC in terms of fault coverage and test length, but higher peak power consumption during the launch-to-capture cycle. This shows the potential benefits of using LOS test scheme provided...
This study investigates the reasons why test power reduction through X-filling techniques works well for cycle-average power reduction but is not so efficient concerning instantaneous peak power reduction.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.