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Thinness‐controlled perovskite wafers are directly prepared using a geometry‐regulated dynamic‐flow reaction system. It is found that the wafers are a superior material for photodetectors with a photocurrent response ≈350 times higher than that made of microcrystalline thin films. Moreover, the wafers are compatible with mass production of integrated circuits.
On page 9204, thinness‐controllable ultrathin perovskite wafers are prepared by Z. Yang, S. Z. (F.) Liu, and co‐workers using a microreactor. Based on the single‐crystalline perovskite wafer, high‐performance photoresponse arrays are fabricated, demonstrating the feasibility of mass production of integrated circuits (ICs) on the perovskite wafer. It is envisioned that the present technique may provide...
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