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This contribution reports a method for increasing the imaging speed of an Atomic Force Microscope. The is done by allowing the complete length of the cantilever beam to interact with the sample surface rather than just the free end. The deflection of the beam is then observed at uniformly distributed points along the beam length using an array of laser spots and detectors. This scheme enables measurement...
The objective of this contribution is to report a low cost implementation of a control system for an atomic force microscope (AFM). AFMs rely on a feedback controller as an integral part of their operation. Currently the controllers shipped with most commercial AFMs are implemented in a closed source manner and provide limited signal access. This restricts the development of novel control strategies...
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