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With the rapid growth of Internet, the amount of malicious codes is exploding. Some security software vendors provide new cloud-based safeguard software for client users. These software, as part of Internet ware, consist of many modules with different functions and Internet behaviors. The Trojan scanning module, for instance, is based on cloud scanning function, which is achieved by collecting a large...
A new test application scheme is proposed for low-power scan testing, which is able to compress test data significantly. A combination of a scan architecture and an existent test compression scheme can compress test data even better. Test power can be reduced greatly based on the new test application scheme, according to which only a subset of scan flip-flops shifts a test vector or captures test...
Scan shift power can be reduced by activating only a subset of scan cells in each shift cycle. In contrast to shift power reduction, the use of only a subset of scan cells to capture responses in a cycle may cause capture violations, thereby leading to fault coverage loss. In order to restore the original fault coverage, new test patterns must be generated, leading to higher test-data volume. In this...
Most previous DFT-based techniques for low-capture-power broadside testing can only reduce test power in one of the two capture cycles, launch cycle and capture cycle. Even if some methods can reduce both of them, they may make some testable faults in standard broadside testing untestable. In this paper, a new test application scheme called partial launch-on-capture (PLOC) is proposed to solve the...
This paper discusses the development and testing of a low-jitter, high-voltage, high-current, and triggered spark-gap switch, designed as part of an intense electron-beam accelerator (IEBA). The voltage/pressure (V/p) curve of the switch was measured for N2 when the gas pressure is 0.10-0.25 MPa with the main gap spacing of 10 mm. In addition, the operating ranges, delay time, and jitter of the switch...
This paper presents two new conflict-driven techniques for improving transition fault coverage using multiple scan chains. These techniques are based on a novel test application scheme, in order to break the functional dependency of broadside testing. The two new techniques analyze the ATPG conflicts in broadside test generation, and try to control the flip-flops with most influence on the fault coverage...
Two conflict-driven schemes and a new scan architecture based on them are presented to improve fault coverage of transition fault. They make full use of the advantages of broadside, skewed-load and enhanced scan testing, and eliminate the disadvantages of them, such as low coverage, fast global scan enable signal and hardware overhead. Test power is also a challenge for delay testing, so our method...
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