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Efficient retrieval of traffic archival data is a must-have technique to detect network attacks, such as APT(advanced persistent threat) attack. In order to take insight from Internet traffic, the bitmap index is increasingly used for efficiently querying over large datasets. However, a raw bitmap index leads to high space consumption and overhead on loading indexes. Various bitmap index compression...
Traffic archival, an indispensable task for network analysis, has suffered from a huge amount of data. These rapid growing data can exceed storage capacity and thwart real-time analysis. In order to take insight from Internet traffic, bitmap indexing is applied in this field. However, raw bitmap indexes can consume more space and longer delay for loading larger indexes into memory. This leads to the...
We present a combined hardware-software based approach to scan-chain diagnosis, when the outcome of a test may be affected by system faults occurring in the logic out-side of the scan chain. For the hardware component we adopt the double-tree scan (DTS) chain architecture, which has previously been shown to be effective in reducing power, volume, and application time of tests for stuck-at and delay...
Shihe bridge in Xinyang city built in 1997 is a a half-through reinforced concrete tied-arch bridge. In order to test and evaluate the loading character, the static and dynamic analysis is performed, the experimental measurement is also performed in January, 2004. In this paper, the structure is analyzed through FEM, the computed result is compared with the measured result. Through the comparison,...
Test power, volume, and time are the major test cost parameters that must be minimized while achieving the desired level of fault coverage. Unlike prior research in delay fault testing that has focused on at most two test cost parameters, the hybrid (LOS+LOC) scheme proposed here simultaneously considers all three cost parameters and achieves better fault coverage than prior schemes, as demonstrated...
The double-tree scan-path architecture, originally proposed for low test power, is adapted to simultaneously reduce the test application time and test data volume under external testing. Experimental results show significant performance improvements over other existing scan architectures.
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