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A dielectric submitted to a prolonged electrical stress will fail at nominal field levels often one or two orders of magnitude below the short term breakdown field. The damage typically consists of multiply branched hollow channels of ∼ µm diameter (electrical trees) which originate at a point of local field enhancement. Another family of damage structures consists of channels much finer in diameter...
A new technique for directly measuring the energy and momentum loss rates of hot electrons as a function of their kinetic energy E in dielectrics is presented. The relation between the dielectric breakdown on one side, the momentum scattering rate γp(E) and the LO phonon emission rate γuLO(E) of hot electrons on the other side is essential and direct and can be seen through the expression equation...
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