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In this paper, we have developed the evaluation results of low cure temperature (less than 200 deg C) dielectric materials in terms of process ability and adhesion on SiN and mold compound substrates. The results showed that the low cure temperature dielectric materials have good adhesion on SiN and mold compound substrate. Integration of thin film passives like inductors, capacitors and band pass...
Developments of ultra fine pitch and high density solder microbumps and assembly process for low cost 3D stacking technologies are discussed in this paper. The solder microbumps developed in this work consist of Cu and Sn, which are electroplated in sequential with total thickness of 10 mum; The under bump metallurgy (UBM) pads used here is electroless plated nickel and immersion gold (ENIG) with...
Developments of ultra fine pitch and high density solder microbumps for advanced 3D stacking technologies are discussed in this paper. CuSn solder microbumps with 25 ??m in pitch are fabricated at wafer level by electroplating method and the total thicknesses of the platted Cu and Sn are 10 ??m. After plating, the micro bumps on the Si chip are reflowed at 265??C and the variation of bump height measured...
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