The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
High‐quality semi‐polar (11‐22) GaN is obtained by means of growth on patterned (113) silicon substrates featured with stripy grooves and extra periodic gaps which are perpendicular to the grooves. Ga melting‐back during the GaN growth at a high temperature is eliminated as a result of special patterning design. On‐axis X‐ray rocking curve measurements show that the linewidth is significantly reduced...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.