Search results for: Shobha Vasudevan
Integration, the VLSI Journal > 2017 > 58 > C > 538-548
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 5 > 858 - 871
Molecular Cell > 2016 > 61 > 5 > 760-773
IFIP — The International Federation for Information Processing > Building the Information Society > Fault Tolerance for Trustworthy and Dependable Information Infrastructures > 257-281
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2014 > 33 > 6 > 945 - 958
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 6 > 952 - 965
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 5 > 788 - 801
Journal of Electronic Testing > 2013 > 29 > 5 > 669-684