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We present results that characterize the performance and capabilities of the JEOL 2100F-LM electron microscope to carry out holography and quantitative magnetic imaging. We find the microscope is well-suited for studies of magnetic materials, or for semi-conductor dopant profiling, where a large hologram width (∼1μm) and fine fringe spacing (∼1.5nm) are obtained with good contrast (∼20%). We present,...
The Transport of Intensity technique is becoming a viable alternative to electron holography for phase retrieval in Transmission Electron Microscopy. However, several issues are still to be clarified in order to ascertain the applicability of the technique; among them, the controversy regarding its geometrical or wave-optical nature, as related to the phase detection limit. We show here that the Transport...
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