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In this study, an analytical model is utilised to extract depth profiles from molecular dynamics simulations of dynamic secondary ion mass spectrometry (SIMS). The depth profiles for dynamic SIMS calculations for a reference system of C60 bombardment of Ag(111) with a kinetic energy of 20 keV and a polar angle of 0° are compared to those for 5 keV bombardment with a polar angle of 0° and 20 keV bombardment...
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