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Quantitative effect and mechanism of Cr on cell performance inside stack are investigated by incorporating Cr in the cathode current-collecting layer (CCCL). The results show that the maximum output power density (MOPD) of the unit cell inside a stack decreases as the Cr content increases beyond 253.81 μg cm−2. The MOPD is independent of Cr when its content is less than 253.81 μg cm−2 at the original...
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