Search results for: D. Roy
Microelectronics Reliability > 2018 > 87 > C > 106-112
2016 IEEE International Reliability Physics Symposium (IRPS) > PR-1-1 - PR-1-4
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-8-1 - XT-8-6
Microelectronic Engineering > 2015 > 147 > C > 10-14
2015 IEEE International Reliability Physics Symposium > 5A.5.1 - 5A.5.5
2014 IEEE International Reliability Physics Symposium > GD.6.1 - GD.6.4
Microelectronic Engineering > 2013 > 109 > Complete > 90-93
2013 IEEE International Reliability Physics Symposium (IRPS) > GD.1.1 - GD.1.4
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.9.1 - XT.9.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.1.1 - 3B.1.4
2011 International Reliability Physics Symposium > HV.1.1 - HV.1.4
Journal of Computational and Applied Mathematics > 2009 > 232 > 2 > 275-284