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The magnetic properties and the electronic states were investigated for a magnetic semiconductor (Zn,Cr)Te co‐doped nitrogen (N) as an acceptor impurity. A series of N‐doped Zn1–xCrxTe thin films with Cr compositions in the range of x = 0.06–0.09 and N concentrations in the range of [N] = 1018–1020 cm–3 were grown by molecular beam epitaxy (MBE), and the magnetization measurement using superconducting...
We investigate the structural and magnetic properties of Zn1–xFex Te with an aim of discerning the intrinsic magnetism of this ternary compounds. Thin films of Zn1–xFex Te with a high Fe composition up to x = 0.2 were grown by molecular beam epitaxy (MBE) in the excess of Te flux against Zn flux. The structural analyses using X‐ray diffraction (XRD) and X‐ray absorption fine structure (XAFS) measurements...
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