Search results for: J.W. Jang
2014 IEEE International Electron Devices Meeting > 29.5.1 - 29.5.4
Journal of Asia-Pacific Biodiversity > 2014 > 7 > 2 > e197-e205
Microelectronics Reliability > 2012 > 52 > 2 > 455-460
2014 IEEE International Electron Devices Meeting > 29.5.1 - 29.5.4
Journal of Asia-Pacific Biodiversity > 2014 > 7 > 2 > e197-e205
Microelectronics Reliability > 2012 > 52 > 2 > 455-460