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Thin films of Bi2Sr2CaCu2O8 (Bi-2212) with the non- $c$-axis (117) orientation were grown by MOCVD on (110) LaAlO3 single crystal substrate. XRD $\theta - 2\theta$ scans show that films contain also (119) and (011)Bi-2212 impurity grains. We propose and report characterization of the non- $c$-axis films by XRD $\varphi - \psi$ scans. By this approach, the assumed theoretical film–substrate relationship...
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