Search results for: Seung-Min Lee
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 471 - 476
IEEE Electron Device Letters > 2011 > 32 > 9 > 1176 - 1178
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 471 - 476
IEEE Electron Device Letters > 2011 > 32 > 9 > 1176 - 1178