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Four definitions of static random access memory (SRAM) cell write margins (WMs) were reexamined by analyzing the dependence of the WM on the SRAM cell transistor threshold voltages (Vth's) in order to find a preferable definition. The WM is expected to obey the normal distribution if the differential coefficients of the WM to Vth's are constant over a wide range of Vth variations. This means that...
An adiabatic 64-kb SRAM circuit with shared reading and writing ports was designed, which enables gradual charging and discharging while maintaining a large VDD so that the problems of VT variation and electromigration in the nanocircuit can be solved. In the writing mode, the voltage of the memory cell ground line is increased to VDD/2 gradually, and the nMOSFET is turned off so that the memory cell...
An adiabatic 1-kb SRAM circuit was designed, which enables gradual charging during writing and reading while maintaining a large VDD so that the problems of VT variation and electromigration in the nanocircuit can be resolved. In the writing mode, the voltage of the memory cell power line is reduced to ground gradually using a high-resistivity nMOSFET, and we turn off the nMOSFET so that the memory...
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