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Pb(Zr 0.53 Ti 0.47 )O 3 (PZT) thin films grown on Pt-coated Si substrates were prepared by a sol–gel process. Crystalline structure characterisation and optical constants (refractive index n, extinction coefficient k) and bandgaps E g of PZT thin films annealed at 550, 600 and 650°C were obtained by X-ray diffraction (XRD) and spectroscopic ellipsometry (SE) in the...
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