Search results for: Do-Hyun Kim
IEEE Electron Device Letters > 2017 > 38 > 8 > 1008 - 1011
2015 IEEE International Electron Devices Meeting (IEDM) > 19.3.1 - 19.3.4
IEEE Electron Device Letters > 2017 > 38 > 8 > 1008 - 1011
2015 IEEE International Electron Devices Meeting (IEDM) > 19.3.1 - 19.3.4