Search results for: Wen Liu
IEEE Sensors Journal > 2018 > 18 > 1 > 122 - 132
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 799 - 801
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 475 - 478
IEEE Electron Device Letters > 2017 > 38 > 6 > 705 - 707
IEEE Electron Device Letters > 2017 > 38 > 6 > 701 - 704