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The presence of copper contamination is known to severely degrade the minority carrier lifetime of p‐type silicon upon exposure to illumination. In this contribution, we have analyzed the recombination activity of light‐activated copper defects in deliberately Cu‐contaminated p‐type silicon by means of a recombination model that quantitatively defines the effect of metallic precipitates on minority...
Defects in multicrystalline silicon for photovoltaic applications and their impact on solar cell parameters have been investigated in the material research network project SolarFocus. A series of multicrystalline silicon ingots of ultrapure feedstock material were cast with intentional addition of typical transition metal impurities (Fe, Cu, Cr) and Ge as doping elements. The results of lifetime measurements,...
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