Search results for: S. Biswas
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2009 > 31 > 5 > 884 - 899
2008 3rd International Design and Test Workshop > 142 - 147
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2009 > 31 > 5 > 884 - 899
2008 3rd International Design and Test Workshop > 142 - 147