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We propose an optical detection method of micro defect by single-pixel imaging microscopy. Our results demonstrate the micro defect imaging by detecting an anisotropic scattered light on mirror surface.
Two-dimension electro-optic imaging combined with a Hartmann sensor enables THz wavefront characterization in time- and frequency-domain without cross-section scanning. Reconstruction with Zernike polynomials method allows qualitative and quantitative analysis as additional advantages.
We demonstrated fast 3D terahertz computed tomography by using real-time line projection of an intense terahertz beam. Peak-to-peak amplitude of the pulsed terahertz electric field and a standard reconstruction algorithm were used to performed final 3D reconstruction of test samples with a total acquisition time to only 6 minutes.
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