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We report the effect of the variation of concentration on the structure and magnetic property of the Ho doped BiFeO3 (Bi1−xHoxFeO3, x=0, 0.05, 0.1, 0.15 and 0.2) thin films. The result shows that all the peaks for BiFeO3, Bi0.95Ho0.05FeO3 and Bi0.9Ho0.1FeO3 thin films can be indexed according to the crystal structure of pure BiFeO3 by X-ray diffraction. A structural transition from the rhombohedral...
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