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We present the first fully integrated implementation of a patch-clamp measurement system with series-access resistance and parasitic capacitive compensation capability. The system was implemented in a 0.5- mum silicon-on-sapphire process and is capable of recording cell membrane currents up to plusmn20 nA, with an rms noise of 5 pA at 10-kHz bandwidth. The system can compensate for the capacitance...
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