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We propose a method to diagnose interconnect short-circuit faults in mesh NoCs. The fault model comprises all shorts between any two wires of a defined NoC neighborhood. Test sequences are applied in NoC functional mode. Experimental results show that 93% of the interconnect shorts can be diagnosed.
Test sequences for interconnection testing in network-on-chips (NoC) are usually small. However, to ensure a good fault coverage, the sequence is usually re-applied for a number of paths configurations in the network. In this paper we first analyze the test configuration time required for a functional test strategy devised for mesh NoCs and we show that this time, specially for BIST-based solutions,...
A novel strategy to detect interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control and communication handshake lines are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.
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