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Atomic resolution scanning transmission electron microscopy (STEM) analysis, in particular the combination of Z-contrast imaging and electron energy-loss spectroscopy (EELS) has been successfully used to measure the atomic and electronic structure of materials with sub-nanometer spatial resolution. Furthermore, the combination of this incoherent imaging technique with EELS allows us to correlate certain...
Structural distortions arising from the condensations of two essential kinds of phonon modes: the triply degenerate rotational modes (φ x ,φ y, φ z ) of MnO 6 and the doubly degenerate Jahn-Teller active modes (Q 1 ,Q 2 ) have been systematically investigated in the perovskite manganites. Microstructural features associated with certain types of...
We propose a novel symmetrization method for solving the transport of intensity equation (TIE) using fast Fourier transforms for situations where the input images may or may not exhibit spatial periodicity. The method is derived from the analysis of intensity conservation law and the internal symmetry of the TIE, and is illustrated for both a computational and an experimental data set.
Electron diffraction and imaging are very sensitive to the valence-electron distribution in materials at small scattering angles. We take advantage of the large dimension of the unit-cell along the c-axis of YBa2Cu3O7 and Bi2Sr2CaCu2O8+δ superconductors, to study the distribution of charge carriers, crucial to understanding the superconducting behaviors in these complex systems. Electron pile-up associated...
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